Analysis Among Main Agronomic Traits of Spring Wheat (Triticum aestivum) in Qinghai Tibet Plateau

1 Northwest institute of plateau biology, Chinese Academy of Sciences. Xining, Qinghai, 81000, P. R. China
2 Graduate University of Chinese Academy of Sciences, Beijing 100049, P. R. China


DEYONG, ZHAO, 2011. Analysis among main agronomic traits of spring wheat (Triticum aestivum) in Qinghai Tibet Plateau. Bulg. J. Agric. Sci., 17: 615-622

In order to reveal the underlying association between agronomic traits of spring wheat in the eastern arable region of Qinghai Tibet Plateau, partial correlation analysis, principal components analysis and cluster analysis were applied to study the relationship between grain yield and agronomic traits. The result of partial correla-tion analysis revealed that gW (r = 0.242) and UW (r = 0.234) correlated positively with yield, while nVe (r = 0.084) and nSnMe (r = 0.040) correlated less positively with yield. gnMe (r = -0.186), SnMe (r = -0.174), FLA (r = -0.114), PH (r = -0.071), LMe (r = -0.043) were negatively correlated with yield. SnMe (r = 0.541) and nSnMe (r = 0.500) were positively correlated with PH, while nVe (r = -0.332) was negatively correlated with PH. SnMe (r = 0.449) was positively correlated with gnMe, while it was negatively correlated with nVe (r = -0.370). LMe and FLA were positively correlated (r = 0.378). Principal components analysis indicated that spring wheat with higher gnMe, gW, FLA, UW seem to possess high-yield potential. The experimental variet-ies were grouped into 14 groups through cluster analysis, the result of which could be informative in high-yield spring wheat breeding program in the future.

Key words: cluster analysis; high-yield; partial correlation; principal components analysis
Abbreviations: flag leaf area (FLA), grain number of main ear (GNME), 1000-grain weight (GW), length of main ear (LMe), non-pregnancy spike number of main ear (nSnMe), number of valide ear (nVe), plant height (PH), spike number of main ear (SnMe), Unit weight(UW), yield (yD)

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